Thermo Scientific Nexsa G2 (XPS)
The Thermo Scientific™ Nexsa G2 X-Ray Photoelectron Spectrometer (XPS) System offers fully automated, high-throughput surface analysis, delivering the data to advance research and development or to solve production problems. The integration of XPS with ion scattering spectroscopy (ISS), UV photoelectron spectroscopy (UPS), reflected electron energy loss spectroscopy (REELS), and Raman spectroscopy, allows you to conduct true correlative analysis. The system now includes options for sample heating and sample biasing capabilities to increase the range of experiments now possible. The Nexsa G2 Surface Analysis System unlocks the potential for advances in materials science, microelectronics, nanotechnology development, and many other applications.
Powerful Performance from Standard Features:
- High-performance X-ray source
- Optimized electron optics
- Sample viewing
- Insulator analysis
- Digital Control
- NX sample heater module
- ISS: Ion scattering spectroscopy is a technique in which a beam of ions is scattered by a surface
- UPS: Ultraviolet photoelectron spectroscopy refers to the measurement of kinetic energy spectra of photoelectrons emitted by molecules which have absorbed ultraviolet photons, in order to determine molecular orbital energies in the valence region
- Raman: Spectroscopic technique used to in chemistry to provide a structural fingerprint
- REELS: Reflection electron energy loss spectroscopy
4. Stage position monitored throughout data acquisition, positions used to generate SnapMap
- Batteries
- Biosurfaces
- Catalysts
- Ceramics
- Glass coatings
- Graphene
- Metals & oxides
- Nanomaterials
- OLEDs
- Polymers
- Semiconductors
- Solar cells
- Thin films
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