Thermo Scientific K-Alpha (XPS)

Designed for Productivity, from Research to Routine

The K-Alpha Spectrometer delivers much improved spectroscopic performance. This leap forward results in faster analysis times, improved element detection, and the possibility to acquire data at higher resolution yielding better chemical state identification.

Analytical options include a vacuum transfer module for moving air-sensitive samples from a glove box to the system, and the tilt module for ARXPS data collection. Equipped with the Thermo Scientific™ Avantage Data System, the complete surface analysis software system, the K-Alpha has a range of software features designed to optimize data interpretation, data reporting and usability. The K-Alpha XPS system meets the requirements of both experienced XPS analysts and newcomers to the technique, bringing together high performance, monochromated XPS and sputter depth profiling, with intelligent automation and intuitive control.

Powerful Performance

• Selectable area spectroscopy
• Sputter depth profiling
• Micro-focused monochromator
• Snapshot acquisition
• High-resolution chemical state spectroscopy
• Insulator analysis
• Quantitative chemical imaging

Unparalleled Ease of Use

• Acquisition — spectra, images, profiles, line scans
• Interpretation — elemental and chemical state identification
• Processing — Quantification, peak fitting, real-time profile display, spectrum-image manipulation, PCA, phase analysis, TFA, NLLSF, PSF removal, optical/XPS image overlays
• Reporting — automatic report generation with simple export to other software packages
• Control — all hardware controlled from the Avantage software interface
• Avantage Indexer — data archive management
• Audit trail logging
• System performance logging
• Calibration on demand
• Full remote operation

Key Features

• Analyzer — 180° double focusing hemispherical analyzer with 128-channel detector
• X-ray source — Al Ka micro-focused monochromator with variable spot size
• Ion Gun — Energy range 100-4000 eV
• Charge Compensation — Dual beam source
• Sample Size — 4-axis sample stage, 60 x 60 mm sample area, 20 mm maximum sample thickness
• Options — Vacuum transfer module, tilt module for ARXPS, sample bias module