SEM 5000 FEG Scanning Electron Microscope support@gravitylabs.gr 29 Ιουνίου, 2026
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SEM 5000 FEG Scanning Electron Microscope

CIQTEK SEM 5000 is a high-resolution, feature-rich field emission scanning electron microscope (FE-SEM, FEG SEM).

Advanced column design, high voltage tunneling technology (SuperTunnel), low aberration non-leakage magnetic objective lens design, to achieve low-voltage high-resolution imaging, while magnetic samples can be applied. Optical navigation, advanced automatic functions, well-designed human-machine interaction, and optimized operation.
Whether experienced or not, one can quickly get started with high-resolution shooting tasks

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Parameters

Key Parameters Resolution 1.0 nm @ 15 kV, SE
1.5 nm @ 1 kV, SE0.8 nm @ 30 kV, STEM
Acceleration voltage 20 V ~ 30 kV
Magnification 1 ~ 2,500,000 x
Electron Gun High brightness Schottky Field Emission Electron Gun
Sample Chamber Vacuum System Fully automatic control, oil-free vacuum system
Camera Dual Cameras
(Optical navigation + in-bin monitor)
Distance X: 120 mm, Y: 115 mm, Z: 50 mm
T: -10°～ +90°, R: 360°
(*Optional extra-large bin version available)
Detectors and Extensions Standard The high-angle electronic detector in the lens column
The side low-angle electronic detector
Optional Flush-mounted mid-angle backscattered electron detector
Automatic retractable scanning transmission electron microscopy (STEM) detector
Sample exchange chamber
High-speed beam gate and electron beam exposure
Energy dispersive spectroscopy (EDS/EDX)
Electron Backscatter Diffraction (EBSD)
Electron-beam-induced current (EBIC)
Cathodoluminescence (CL)
High and low temperature in-situ stretching table
nanoManipulator
Large-Scale Image StitchingTrackball & Knob Control Panel
Software Operating System Windows
Navigation Optical Navigation, Gesture Quick Navigation
Automatic Functions Auto Brightness Contrast, Auto Focus, Automatic Dissipation

 

 

 

 

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