SEM 2000 Tungsten Filament Scanning Electron Microscope

The CIQTEK SEM2000 is a basic and versatile analytical tungsten filament scanning electron microscope with 20 kV resolution up to 3.9 nm and support for upgrading to 30 kV, allowing observation of microstructural information of sub-microscale samples.
It has a larger range of motion than a desktop / benchtop SEM and is suitable for rapid screening of samples, and has more expansion interfaces for BSED, EDS/EDX, and other accessories to enable a wider range of applications.

Category: Tungsten SEM Tags: EDX, EBSD, CL, materials science, CIQTEK, microscopy, scanning electron microscope, SEM

Description

Parameters

Electro-Optical Systems	Electron Gun	Pre-aligned medium-sized fork-type tungsten filament
	Resolution	3.9 nm @ 20 kV (SE)
	Resolution	4.5 nm @ 20 kV (BSE)
	Magnification	1 x～300,000 x
	Acceleration Voltage	0.5 kV ~ 20 kV
Imaging Systems	Detector	Secondary Electron Detector (ETD)
	Detector	Backscattered electron detector (BSED), energy spectrometer EDS, etc.
	Image Format	TIFF, JPG, BMP, PNG
Vacuum System	High Vacuum	Better than 5×10^-4Pa
	Control Mode	Fully automated control system
	Pumps	Mechanical Pump ×1, Molecular Pump ×1
Sample Chamber	Camera	Optical Navigation
	Sample Table	Two-axis automatic
	Distance	X: 100 mm
	Distance	Y: 100 mm
Software	Operating System	Windows
	Navigations	Optical Navigation, Gesture Quick Navigation
	Automatic Functions	Auto Brightness Contrast, Auto Focus, Automatic Dissipation
	Special Functions	Intelligent Assisted Dispersion, *Large-Scale Image Stitching (Optional accessories)
Installation Requirements	Space	L ≥ 3000 mm, W ≥ 4000 mm, H ≥ 2300 mm
	Temperature	20°C (68°F) ~ 25°C (77°F)
	Humidity	≤ 50 %
	Power Supply	AC 220 V(±10 %), 50 Hz, 2 kVA

SEM 2000 Tungsten Filament Scanning Electron Microscope

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