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FIB - SEM DB500 - Rigas Labs

FIB – SEM DB500

FIB-SEM BD500 is the newest addition to Ciqtek’s SEM product line, using a focused ion beam (FIB) to modify a sample and a FEG scanning electron microscope (SEM) to image it.

Category: FIB-SEM Dual Beam Microscopy Tags: CIQTEK, SEM, scanning electron microscopy, FIB, dual beam

Description

FIB-SEM has many applications, such as:

Analyzing, depositing, and removing materials in a specific location, especially for semiconductors and materials science.
Making thin and high-quality samples for transmission electron microscopy (TEM) from different kinds of materials.
Visualizing and characterizing structures below the surface and in 3D by alternating FIB cutting and SEM imaging.
Creating and designing devices at the nanoscale by FIB carving and adding.

DB500-FIB-SEM (1)

FIB – SEM DB500

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